Overview:
Rapid rate thermal cycle chamber is used for high temperature rate of change with uniformity and repeatability.
This is ideal for test requiring quick changes of temperature with 23°C/Min. ramp rate in air and temperature of 15°C/Min ramp rate for specimen temperature. It covers various application for standards JEDLC, IEC STD, ISO STD, MIL STD for environmental stresses screening (ESS). It has temperature control for maintaining linear specimen temperature change during rapid temperature cycling and ramp controls.
Compatible Test standards:
- IEC-60749-25: Semiconductor devices – Temperature cycling.
- IEC-60068-2-14 Nb: Environmental testing – change of temperature.
- IEC-61147: Liquid crystal and solid-state display devices – Environmental, endurance and mechanical test method.
- JESD22-A105-B: Solid state devices, testing quality and reliability – Power and temperature cycling.
- SAE-J1211: Automotive components – Recommended environmental practices for electronic equipment design.
Salient features:
- Workspace dimensions: 425(W) x 300(H) x 600(D) mm.
- Temperature: minus 70°C to +180°C and visa versa.
- Ramp rate: 30°C/Min using LN2.
- Temperature maintenance: By cascade refrigeration system with CFC free R404a and R23 refrigerants working on PT100 sensor & having imported 2Nos. Manuerop compressors.
- Instrumentation: Imported Watlow model F4T temperature programmer controller. It has tru-tune control algorithm, 40 profile up to 50 steps each with battery backup and real-time clock, Up to 4 PID control channels & math and logic for total process and machine control.
- Ethernet Modbus TCP/SCPI, 2 USB hosts post, USB device post, 230/485 Modbus, USB , USB port for serial communication access & lab view driven by SCPI protocol.
- Port holes with rubber stopper.
- Viewing window with interior halogen lamp.
